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Technical Session -  IMDSP5   
 
Session IMDSP5:    Image Analysis and Segmentation I   (Poster)
Time and Place:    Wednesday, May 13,  1:00 pm - 3:00 pm,  Ballroom 4A
Chair:    J. Zerubia (INRIA, France)
 
 
1:00 pm    IMDSP5.1
An Operational Approach to Monitor Vegetation Using Remote Sensing
S. Bouzidi, J. Berroir, I. Herlin  (INRIA, France);  
[abstract] [manuscript]
 
  IMDSP5.2
Face Extraction from Non-Uniform Background and Recognition in Compressed Domain
N. Tsapatsoulis, N. Doulamis, A. Doulamis, S. Kollias  (National Technical University of Athens, Greece);  
[abstract] [manuscript]
 
  IMDSP5.3
An Integral Stochastic Approach to Image Sequence Segmentation and Classification
P. Morguet, M. Lang  (Munich University of Technology, Germany);  
[abstract] [manuscript]
 
  IMDSP5.4
Characterization of One-Dimensional Texture -- A Point Process Approach
M. Zacksenhouse, G. Abramovich, G. Hetsroni  (Technion - Israel Institute Technology, Israel);  
[abstract] [manuscript]
 
  IMDSP5.5
Entropy-Based Detection of Microcalcifications in Wavelet Space
G. Boccignone  (Università di Salerno, Italy);   A. Chianese, A. Picariello  (Università di Napoli Federico II, Italy);  
[abstract] [manuscript]
 
  IMDSP5.6
Improved Automatic Target Recognition Using Singular Value Decomposition
V. Bhatnagar, A. Shaw  (Wright State University, USA);   R. Williams  (Wright Patterson AFB, USA);  
[abstract] [manuscript]
 
  IMDSP5.7
Hidden Markov Models for Face Recognition
A. Nefian, M. Hayes  (Georgia Institute of Technology, USA);  
[abstract] [manuscript]
 
  IMDSP5.8
Texture Characterization Using 2D Cumulant-Based Lattice Adaptive Filtering
M. Sayadi  (ESSTT, France);   V. Buzenac-Settineri  (LESTER-UBS, France);   M. Najim  (ESI-ENSERB, France);  
[abstract] [manuscript]
 
  IMDSP5.9
Land Use Classification of SAR Images Using a Type II Local Discriminant Basis for Preprocessing
L. Rogers, C. Johnston  (Vexcel Corporation, USA);  
[abstract] [manuscript]
 
  IMDSP5.10
Cropland Detection with SAR Interferometry: A Segmentation Model
E. Huot, I. Herlin  (INRIA, France);  
[abstract] [manuscript]
 
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